Electromigration effects on semiconductor devices used under AC conditions have typically been approximated using “corrected” results from DC testing. However, the ongoing miniaturization of components and the need to re-evaluate traditional DC-to-AC correction factors have created a growing demand for advanced testing tools and techniques that more accurately simulate “real-world” degradation of devices under AC conditions. To meet this demand, QualiTau has developed the ACE2 electromigration pulsed testing system.