Electromigration effects on semiconductor devices used under AC conditions have typically been approximated using ”corrected” results from DC testing. However, the ever-increasing miniaturization of components and the need to question the traditional DC to AC correction factors has produced a growing demand for advanced testing tools and techniques that more closely simulate ”real-world” degradation of devices used under AC conditions. To meet this demand, QualiTau has developed the the ACE2 electromigration pulsed testing.