Multi Probe

Multi-Site Parallel Water-Level Probing System

Multi-Site Parallel Wafer-Level Probing System

The QualiTau Multi-site Probe system is not just a probe card, but a complete probing solution for testing 10s to 100s of DUTs simultaneously. It includes the probe station, anti-vibration table, light tight enclosure, digital camera with high powered optics, optional vacuum hot chuck, multiple-pin mini-probe cards, and QualiTau’s patented technique of placing multiple probe cards across the surface of a wafer. This technique provides the positioners with multi-dimensional alignment control including global X, Y, Z and Theta adjustment on the chuck, X and Y adjustments on the rails, and X, Y, and Z fine adjustments on each positioner head