The QualiTau Multi-site Probe system is more than just a probe card—it’s a comprehensive probing solution capable of testing tens to hundreds of DUTs simultaneously. The system includes a probe station, an anti-vibration table, a light-tight enclosure, a digital camera with high-powered optics, an optional vacuum hot chuck, multiple-pin mini-probe cards, and QualiTau’s patented technique of positioning multiple probe cards across the wafer surface. This technique enables multi-dimensional alignment control, featuring global X, Y, Z, and Theta adjustments on the chuck, X and Y adjustments on the rails, and precise X, Y, and Z fine-tuning on each positioner head.